[Show abstract][Hide abstract] ABSTRACT: This paper reports recent total ionizing dose (TID) test results obtained at JPL. Several device samples were analyzed exhibiting significant failure levels and enhanced low dose rate sensitivity (ELDRS) effects under biased and unbiased conditions.
Radiation Effects Data Workshop, 2004 IEEE; 08/2004
[Show abstract][Hide abstract] ABSTRACT: We present results of continuing efforts to evaluate total dose bias dependency and ELDRS effects in bipolar linear microcircuits. Several devices were evaluated, each exhibiting moderate to significant bias and/or dose rate dependency.
Radiation Effects Data Workshop, 2003. IEEE; 08/2003
[Show abstract][Hide abstract] ABSTRACT: Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited enhanced low dose rate sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrates results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.
Radiation Effects Data Workshop, 2002 IEEE; 02/2002