Huneung Lee

Publications (2)4.94 Total impact

• Article: Investigation of CdS thin films by a near-field microwave microprobe.

  Tigran Sargsyan, Artur Hovsepyan, Harutyun Melikyan, Youngwoon Yoon, Huneung Lee, Arsen Babajanyan, Mijung Kim, Deokjoon Cha, Kiejin Lee
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  ABSTRACT: Cadmium sulphide (CdS) thin films with different microstructures and morphologies were measured by using a near-field microwave microprobe (NFMM). The NFMM system was coupled to a dielectric resonator with a distance regulation system at an operating frequency f=4.1 GHz. The changes in dielectric permittivity of CdS thin films due to different annealing temperatures were investigated by measuring the reflection coefficient S(11). CdS thin films with different microstructures and morphology were characterized by X-ray diffraction, atomic force microscopy and NFMM.
  Ultramicroscopy 06/2008; 108(10):1062-5. · 2.47 Impact Factor
• Article: Characterization of Alq3 thin films by a near-field microwave microprobe.

  Artur Hovsepyan, Huneung Lee, Tigran Sargsyan, Harutyun Melikyan, Youngwoon Yoon, Arsen Babajanyan, Barry Friedman, Kiejin Lee
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  ABSTRACT: We observed tris-8-hydroxyquinoline aluminum (Alq3) thin films dependence on substrate heating temperatures by using a near-field microwave microprobe (NFMM) and by optical absorption at wavelengths between 200 and 900 nm. The changes of absorption intensity at different substrate heating temperatures are correlated to the changes in the sheet resistance of Alq3 thin films.
  Ultramicroscopy 06/2008; 108(10):1058-61. · 2.47 Impact Factor