S. Zimmermann,
J. Anderson,
J. Andresen,
E. Barsotti,
J. Chramowicz,
G. Duerling,
M. Gao,
H. Gonzalez,
B. Haynes,
W. Knopf, [......],
S. Harder,
H. Hill,
J. Huth,
J. O'Kane,
J. Oliver, H. Robins,
M. Spiropulu,
R. Strohmer,
M. Gold,
T. Thomas
[show abstract]
[hide abstract]
ABSTRACT: A test stand for the next generation of the Silicon Vertex
Detector (SVX-II) of the Collider Detector Facility (CDF) at Fermilab
has been developed. It is capable of performing cosmic ray, beam, and
laser pulsing tests on silicon strip detectors using the new generation
of SVX chips. The test stand is composed of a SGI workstation, a VME
CPU, the Silicon Test Acquisition and Readout (STAR) board, the Test
Fiber Interface Board (TFIB), and the Test Port Card (TPC). The STAR
mediates between external stimuli for the different tests and produces
appropriate high level commands which are sent to the TFIB. The TFIB, in
conjunction with the TPC, translates these commands into the correct
logic levels to control the SVX chips. The four modes of operation of
the SVX chips are configuration, data acquisition, digitization, and
data readout. The data read out from the SVX chips is transferred to the
STAR. The STAR can then be accessed by the VME CPU and the SGI
workstation for future analyses. The detailed description of this test
stand will be given
IEEE Transactions on Nuclear Science 07/1996; · 1.45 Impact Factor
