Publications (1)0 Total impact
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Conference Proceeding: Nanometer-scale imaging of field emission current from HfC thin films
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ABSTRACT: The STM/FE images in a nanometer scale were successfully obtained by using an STM for the first time. The emission of electrons from grain boundaries of polycrystalline HfC films also reported, where work function is larger than that on the grains.Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International; 08/2005
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Institutions
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2005
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University of Tsukuba
Tsukuba, Ibaraki-ken, Japan
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