L. Nevill

Publications (1)0 Total impact

• Conference Proceeding: Effects of Source Diffusion on SILC and Cycling-Induced Charge Loss in Source-Bias Erase Flash Cells

  Chun Chen, J. Kessenich, P. Rudeck, R. Ghodsi, W. Kinney, A. Bicksler, K. Prall, L. Nevill, A. Mihnea
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  ABSTRACT: Not Available
  Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st; 02/2006