Gaofeng Guo

Publications (2)1.49 Total impact

• Article: A test system for complex permittivity measurements of low-loss materials at high temperatures up to 2000 °C

  Gaofeng Guo, En Li, Zhongping Li, Qishao Zhang, Fengmei He
  [show abstract] [hide abstract]
  ABSTRACT: A microwave test system to measure the complex permittivity of a low-loss material as a function of temperature has been developed, and it is based on the short-circuited line method. The calibration method for the microwave loss and the phase of the waveguide holder which vary with temperature is discussed in detail. Induction heating is employed to shorten the heating and cooling time of the sample and waveguide. The test system was built at 10 GHz and over the temperature range from room temperature to 2000 °C. The feasibility of the system has been verified by measuring the complex permittivity of quartz at high temperatures.
  Measurement Science and Technology 03/2011; 22(4):045707. · 1.49 Impact Factor
• Conference Proceeding: Broadband complex permittivity measurement of low loss dielectric disks by cylindrical cavity

  En Li, Gaofeng Guo, Qishao Zhang
  [show abstract] [hide abstract]
  ABSTRACT: In this paper, the complex permittivity of low loss microwave dielectric disk is measured in broad frequency band by applying cylindrical cavity. The measurement frequency band covers 7-18 GHz by using only one cavity which works in multimode. The paper mainly discusses the design of the cavity, measurement theory and mode search method after the sample is loaded. The length of the cavity does not need to be tuned during the process of measurements.
  Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings; 01/2006