C. Lapihuska

Publications (2)0 Total impact

• Conference Proceeding: A test methodology to support an ASEM MCM foundry

  T. Storey, C. Lapihuska, E. Atwood, L. Su
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  ABSTRACT: MCM testing can be challenging enough when the chip, substrate, and MCM design are within the control of the same company. In the foundry environment, however, even more robust strategies must be adopted. In this paper a test methodology is described which consolidates the various MCM test stages to form a flexible, low-cost, quick turn-around-time test flow
  Test Conference, 1994. Proceedings., International; 11/1994
• Conference Proceeding: A Test Methodology to Support an ASEM MCM Foundry.

  Thomas M. Storey, C. Lapihuska, E. Atwood, L. Su
  Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994; 01/1994