Chu Xiang

Publications (1)0 Total impact

• Source

  Available from: smu.edu

  Conference Proceeding: Total ionizing dose and single event effect studies of a 0.25μm CMOS serializer ASIC

  Chu Xiang, Tiankuan Liu, Cheng-An Yang, Ping Gui, W. Chen, Junheng Zhang, Peiqing Zhu, Jingbo Ye, R. Stroynowski
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  ABSTRACT: A 0.25 μm CMOS serializer ASIC, designed using radiation tolerant layout practice, was exposed to proton beam at various flux levels and accumulated fluence over 1.9times10¹⁵ protons/cm² (100 Mrad (Si)). The ASIC survived this total ionizing dose (TID) with no degradation in function. Single event effect (SEE) cross-sections are also calculated.
  Radiation Effects Data Workshop, 2007 IEEE; 08/2007