D. Baudry

Publications (9)2.38 Total impact

• Article: Post-processing of electric field measurements to calibrate a near-field dipole probe

  Z. Riah, D. Baudry, M. Kadi, A. Louis, B. Mazari
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  ABSTRACT: Modelling radiated emissions of electronic components requires accurate measurements. The models based on electric and/or magnetic dipoles are essential to study electromagnetic interference problems in advanced simulation tools. Obtaining exact measurement data requires high-quality probes (i.e. probes that have both good spatial resolution and suitable sensitivity) belonging to the near-field test bench system. However, designing such probes is not possible. In this work, the authors have proven that an electric dipole probe can be calibrated by using the plane wave spectrum theory if the measured signal is noiseless. This is realised by using three kinds of `measurement signal`: analytical `measurement signal`, which is considered as an ideal signal; simulated `measurement signal` in three-dimensional simulation tool, based on the finite integration technique method, which presents only the probe intrusion effect; and finally the measured signal with the near-field test bench.
  IET Science Measurement ? Technology 04/2011; · 0.60 Impact Factor
• Source

  Available from: edu.dz

  Conference Proceeding: Near-field coupling model between electronic systems and a transmission line

  C. Leseigneur, P. Fernández López, C. Arcambal, D. Baudry, A. Louis
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  ABSTRACT: This paper presents an analysis of radiated electromagnetic disturbances between electronic devices (parasitic emission source) and a transmission line. The study aims to model the coupling and for this purpose, two concepts are combined: the emission source is modelled by an array of elementary dipoles (electric and magnetic) and the induced voltage in the transmission line is calculated from the equivalent sources radiation by two different approaches. The first one is totally analytical and is based on the transmission line theory and Taylor model. The second one uses the insertion of equivalent sources into an electromagnetic simulation tool. To validate our model we apply it for two cases: a passive system and an active one disturbing a transmission line.
  Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on; 08/2010
• Article: Simple Electromagnetic Modeling Procedure: From Near-Field Measurements to Commercial Electromagnetic Simulation Tool.

  P. Fernandez Lopez, C. Arcambal, D. Baudry, S. Verdeyme, Bélahcène Mazari
  IEEE T. Instrumentation and Measurement. 01/2010; 59:3111-3121.
• Conference Proceeding: Caractérisation des émissions rayonnées de composants avec prise en compte de la température

  M. E. A.; Malki, C.; Arcambal, D.; Baudry, M.; Ramdani
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  ABSTRACT: L’électronique actuelle connait une intégration de plus en plus poussée et une montée constante en fréquence. Cette évolution rend les dispositifs électroniques plus sensibles aux perturbations électromagnétiques ; leur comportement électromagnétique peut alors être modifié. Toutefois, d’autres contraintes comme la température peuvent venir altérer leur fonctionnement. Il faut alors être capable de caractériser un composant d’un point de vue compatibilité électromagnétique tout en prenant en compte l’aspect température. Dans ce papier, nous présentons un dispositif de chauffage associé à un banc de mesure champ proche permettant de mesurer les champs électromagnétiques émis par un dispositif soumis à une température ambiante pouvant atteindre 125°C. A l’aide de ce dispositif, le rayonnement d’un transistor est caractérisé à 25°C et 100°C.
  6th International conference JFMMA & TELECOM, Agadir, Morrocco; 03/2009
• Article: Plane wave spectrum theory applied to nearfield measurements for electromagnetic compatibility investigations

  D. Baudry, M. Kadi, Z. Riah, C. Arcambal, Y. Vives-Gilabert, A. Louis, B. Mazari
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  ABSTRACT: Electromagnetic near-field measurement is commonly used to characterise radiated emissions of electronic devices and to study interferences between components and systems. To reduce the number of measurements that usually take a long time, the authors apply a post-processing technique based on the plane wave spectrum (PWS) theory. This post-processing enables the computation of the magnetic field at various distances above the device from two planar measurements only. The authors first present the theory of the PWS approach and in a second step, it is applied to a passive circuit to validate the process. Finally, post-processing is applied to an active circuit.
  IET Science Measurement ? Technology 02/2009; · 0.60 Impact Factor
• Conference Proceeding: Near-field investigation of the radiated susceptibility of printed circuit boards

  S. Atrous, D. Baudry, E. Gaboriaud, A. Louis, B. Mazari, D. Blavette
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  ABSTRACT: This paper aims at studying the near-field coupling between PCB and electromagnetic waves by using the transmission line theory. We present a model of coupling between a non-uniform electromagnetic field and a printed circuit board with an analytical resolution in the frequency domain. A first validation is made by using a plane wave excitation. In a second step, we study the coupling between a non uniform wave and a printed circuit board (PCB) in near field.
  Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on; 10/2008
• Article: Applications of the Near-Field Techniques in EMC Investigations

  D. Baudry, C. Arcambal, A. Louis, B. Mazari, P. Eudeline
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  ABSTRACT: A completely automatic near-field mapping system has been developed within the Research Institute for Electronic Embedded Systems (IRSEEM) in order to determine the electromagnetic field created by electronic systems and components. This test bench uses a 3-D positioning system of the probe to make accurate measurements. This paper presents some applications of the near-field techniques in EMC investigations. In the first part, near-field measurements are used to locate precisely the electromagnetic sources of a limiter device. In the second part, we present an equivalent model of the radiated emission of an integrated circuit. In the last part, the near-field test bench is used to characterize faults in a cable.
  IEEE Transactions on Electromagnetic Compatibility 09/2007; · 1.18 Impact Factor
• Conference Proceeding: Near-field techniques for detecting EMI sources

  D. Baudry, F. Bicrel, L. Bouchelouk, A. Louis, B. Mazari, P. Eudeline
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  ABSTRACT: A completely automatic near-field mapping system has been developed within IRSEEM (French research institute for electronic embedded systems) in order to determine the electric field radiated by electronic systems. This test bench uses a 3D probe positioning system to make accurate measurements. The paper presents a validation of the test bench on a microstrip line and experimental results realized on a diode limiter function.
  Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on; 09/2004
• Source

  Available from: institut-telecom.fr

  Article: Overview of emission and susceptibility investigation and modeling with near-field measurements.

  D Baudry, A Louis, B Mazari
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  ABSTRACT: Over the last years, the techniques of measurement in near field have experienced a significant development in the area of electromagnetic compatibility. These techniques are used to locate emission sources, to extract equivalent models of radiation and to study the local susceptibility. After a brief overview of the methods that are used to measure the near electromagnetic field, several applications of this technique are presented. These applications cover the study of emission and susceptibility phenomena from the component (passive or active) to the system.