Publications (2)1.68 Total impact
-
Article: Analysis of minimum selection H-S/MRC in Rayleigh fading
[show abstract] [hide abstract]
ABSTRACT: We analyze the error performance of an improved hybrid selection/maximal-ratio combining (H-S/MRC) technique called minimum selection H-S/MRC in flat Rayleigh fading for coherent digital modulation schemes. Here the minimum number of diversity branches are selected such that their combined signal-to-noise ratio is above a given threshold. We derive a closed-form expression for the distribution of the number of selected branches. This distribution is used to obtain the symbol error probability.IEEE Transactions on Communications 06/2005; · 1.68 Impact Factor -
Conference Proceeding: Analysis of minimum selection GSC in Rayleigh fading
[show abstract] [hide abstract]
ABSTRACT: This paper analyzes the error performance of an improved generalized selection combining (GSC) technique called minimum selection GSC (MS-GSC) in flat Rayleigh fading for coherent digital modulation schemes. Here the minimum number of diversity branches is selected such that their combined signal-to-noise ratio (SNR) is above a given threshold. The threshold chosen here is determined by the combiner output SNR rather than individual branch SNRs as done in absolute threshold GSC (AT-GSC) and normalized threshold GSC (NT-GSC). As a result, MS-GSC uses less resource than AT-GSC or NT-GSC to give the same performance. We obtain a closed-form expression for the distribution of the number of selected branches followed by a closed-form expression for the characteristic function (c.f.) of the combiner output SNR. This c.f. is used to obtain the symbol error probability for different digital modulation schemes. Numerical results for M-ary phase-shift keying are presented as an example.Communications, 2004 IEEE International Conference on; 07/2004
Top Journals
Institutions
-
2005
-
Indian Institute of Technology Delhi
- Department of Electrical Engineering
New Delhi, NCT, India
-
-
2004
-
Illinois Institute of Technology
- Department of Electrical & Computer Engineering
Chicago, IL, USA
-