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ABSTRACT: Parallel testing provides an increase in throughput without a corresponding increase in cost, by performing tests on multiple devices under test at the same time. Addition of this capability to a modular, re-configurable, open architecture test system paves the way for an even more cost-effective solution. This paper describes the parallel test strategy adopted in the T2000 tester from Advantest Corporation, which is based on the OPENSTAR™ platform.
Test Conference, 2005. Proceedings. ITC 2005. IEEE International; 12/2005
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ABSTRACT: This work addresses two key concepts in device test program development: test class programming and pattern management. These are explored in the context of an open architecture test system, where the primary requirement is the flexibility to integrate externally developed capabilities into the system. Development against an open architecture test system includes the integration of software-based solutions (such as user-developed test classes) and third party hardware modules, including the software necessary to support the modules. This work focuses on the open architecture facets of test programming and pattern management, as embodied in the OPENSTAR™ specification. The software for Advantest Corporation's T2000 system is used as a concrete example for highlighting these concepts.
Test Conference, 2004. Proceedings. ITC 2004. International; 11/2004
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Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European; 06/2004
