ABSTRACT: We propose a new scan BIST method for transition faults. The method uses a Markov source for test pattern generation. We develop this method for skewed-load testing as well as for broadside testing. In the design of a Markov source for transition faults, we first use statistics of deterministic tests for stuck-at faults. Then, we propose a new method for identifying subsets of stuck-at tests whose statistics are useful in detecting hard-to-detect transition faults. Finally, by using statistics of tests for transition faults, we detect all the remaining detectable transition faults. The method reported achieves complete coverage of detectable transition faults in benchmark circuits using a limited number of pseudo-random tests.
Quality Electronic Design, 2004. Proceedings. 5th International Symposium on; 02/2004