[Show abstract][Hide abstract] ABSTRACT: We have developed and tested a wide-field coherent anti-Stokes Raman scattering (CARS) microscopy technique, which provides the simultaneous imaging of an extended illuminated area without scanning. This method is based on the non-phase-matching illumination of a sample and imaging of a CARS signal with a CCD camera using conventional microscope optics. We have identified a set of conditions on the illumination and imaging optics, as well as on sample preparation. Imaging of test objects proved high spatial resolution and chemical selectivity of this technique.
[Show abstract][Hide abstract] ABSTRACT: We report a wide-field Coherent Anti-Stokes Raman Scattering (CARS) microscopy technique based on non-phasematching illumination and imaging systems. This technique is based on a non-collinear sample illumination by broad laser beams and recording image of sample at anti-Stokes wavelength using full-frame image detector. An amplified Ti:Sapphire laser and an Optical Parametric Amplifier (OPA) provided picosecond pump and Stokes beams with energies sufficient for CARS generation in an area of 100 µm in diameter. The whole field of view of the microscope was illuminated simultaneously by the pump and Stokes beams, and CARS signal was recorded onto a cooled CCD, with resolution determined by the microscope objective. Several illumination schemes and several types of thin sample preparations have been explored. We demonstrated that CARS image of a 100x100 µm sample can be recorded with submicrometer spatial resolution using just a few laser pulses of microJoule energies.
[Show abstract][Hide abstract] ABSTRACT: We report methods of near-field infrared microscopy with transient optically induced probes. The first technique - a transient aperture (TA) - uses photoinduced reflectivity in semiconductors to generate a relatively large transient mirror (TM) with a small aperture at its centre. We report the optical properties of the TM and TA and experiments performed on near-field imaging with the TA. The second technique is based on solid immersion microscopy, in which high resolution is achieved when light is focused inside a solid with a high refractive index. By creating a transient Fresnel lens on the surface of a semiconductor wafer via photoinduction, we were able to form a solid immersion lens (SIL) for use as a near-field probe. The use of transient probes eliminates the need for mechanical scanning of the lens or sample, and thus provides a much faster scanning rate and the possibility to work with soft and liquid objects.
Journal of Microscopy 07/2003; 210(Pt 3):307-10. · 1.63 Impact Factor