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Publications (2)0 Total impact

  • S. Rehfuss, C. Gorecki, D. Peters, R. Laur
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    ABSTRACT: A method will be presented which is suitable to calculate the overall and partial capacitances of two rectangularly shaped conductors over a three-layered material. It is based on the complex image method. The solution for the determination of the necessary exponential terms used by the complex image method is shown. The terms are calculated using an iterative approach which will be compared with a previous method. The complex images are used to calculate the partial capacitances of the desired structures. The used structure consists of a three-layered material underneath the conductors but a multi-layered material can also be modelled. The method which has to be used in the case of a multi-layered material will also be presented.
    Design, Test, Integration and Packaging of MEMS/MOEMS 2003. Symposium on; 06/2003
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    ABSTRACT: A closed form expression for the electrical field of a line source over a multi-layered material can only be derived fro special geometries and cases. The use of the spectral domain, but this expression can normally not be transferred back into the space-domain. The solution is an approximation in the spectral domain by use of exponential terms which can easily be transferred back into the space-domain. This is done by use of Prony's method. The number of exponential terms has to be correctly estimated to avoid numerical difficulties. This paper presents a sophisticated method to determine the necessary number of exponential terms and shows how this approximation can be used to calculate inductances and capacitances for conductors with rectangular cross-sections.
    Proc SPIE 04/2002;