Article

A complete analysis of the laser beam deflection systems used in cantilever-based systems

MIT Media Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Ultramicroscopy (Impact Factor: 2.75). 04/2007; 107(4-5):422-30. DOI: 10.1016/j.ultramic.2006.11.001
Source: PubMed

ABSTRACT A working model has been developed which can be used to significantly increase the accuracy of cantilever deflection measurements using optical beam techniques (used in cantilever-based sensors and atomic force microscopes), while simultaneously simplifying their use. By using elementary geometric optics and standard vector analysis it is possible, without any fitted or adjustable parameters, to completely and accurately describe the relationship between the cantilever deflection and the signal measured by a position sensitive photo-detector. By arranging the geometry of the cantilever/optical beam, it is possible to tailor the detection system to make it more sensitive at different stages of the cantilever deflection or to simply linearize the relationship between the cantilever deflection and the measured detector signal. Supporting material and software has been made available for download at http://www.physics.mun.ca/beauliu_lab/papers/cantilever_analysis.htm so that the reader may take full advantage of the model presented herein with minimal effort.

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