Dynamic speckle illumination microscopy with wavelet prefiltering

Boston University, Department of Biomedical Engineering, Boston, Massachusetts 02215, USA.
Optics Letters (Impact Factor: 3.29). 07/2007; 32(11):1417-9. DOI: 10.1364/OL.32.001417
Source: PubMed


Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.

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    • "d dynamic speckle illumination microscopy ( Ventalon et al . , 2007 ) . For these techniques , algorithms have been described that do not require the knowledge of the illumination pattern but that allow to achieve super - resolution and improved optical sectioning using non - linear image - processing strategies ( Heintzmann and Benedetti , 2006 ; Ventalon et al . , 2007 ) . PiMP uses a similar principle ( without the need of upfront knowledge of the structure or the illumination pattern ) but uses a stochastic process instead of projecting a random pattern for optical sectioning and super - resolution . Therefore unlike non - linear techniques such as non - linear SIM and STED ( Gustafsson , 2005 ; Hei"
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    • "However, the in-plane spatial resolution of the photo-acoustic images achievable is limited by the effective bandwidth of the ultrasonic detector; leading to few tenths microns diffraction limited spatial resolution and even worse for axial resolution [10]. Dynamic speckle illumination microscopy (DSI) [11] presents a simple yet robust technique to obtain optical sectioning and out-of-focus background rejection with a widefield microscope coupled with speckle illumination and spatial wavelet prefiltering. However, there are no demonstrations of DSI imaging with penetration depth larger than 100um up to date. "
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