Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination - art. no. 62920A

Institute of Micromechanics and Photonics, Warsaw University of Technology, Warszawa, Masovian Voivodeship, Poland
Applied Optics (Impact Factor: 1.78). 08/2007; 46(21):4613-24. DOI: 10.1364/AO.46.004613
Source: PubMed


Two-beam interferogram intensity modulation decoding using spatial carrier phase shifting interferometry is discussed. Single frame recording, simplicity of experimental equipment, and uncomplicated data processing are the main advantages of the method. A comprehensive analysis of the influence of systematic errors (spatial carrier miscalibration, nonuniform average intensity profile, and nonlinear recording) on the modulation distribution determination using automatic fringe pattern analysis techniques is presented. The results of searching for the optimum calculation algorithm are described. Extensive numerical simulations are compared with laboratory findings obtained when testing vibrating silicon microelements under various experimental conditions.

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    ABSTRACT: An advanced spatial carrier phase-shifting (SCPS) algorithm based on least-squares iteration is proposed to extract the phase distribution from a single spatial carrier interferogram. The proposed algorithm divides the spatial carrier interferogram into four phase-shifted interferograms. By compensating for the effects of the variations of phase shifts between pixels and the variations of background and contrast, the proposed algorithm determines the local phase shifts and phase distribution simultaneously and accurately. Numerical simulations show that the accuracy of the proposed algorithm is obviously improved by compensating for the effects of background and contrast variations. The peak to valley of the residual phase error remains less than 0.002 rad when the magnitude of spatial carrier is in the range from pi/5 to pi/2 and the direction of the spatial carrier is in the range from 25 degrees to 65 degrees. Numerical simulations and experiments demonstrate that the proposed algorithm exhibits higher precision than the existing SCPS algorithms. The proposed algorithm is sensitive to random noise, but the error can be reduced by N times if N measurements are taken and averaged.
    Applied Optics 11/2008; 47(29):5446-53. DOI:10.1364/AO.47.005446 · 1.78 Impact Factor
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    ABSTRACT: This paper focuses on the applicability of the temporal (TPS) and spatial carrier (SCPS) phase-shifting techniques to the time-average interferogram intensity modulation distribution determination. Both techniques use the same mathematical formulae, but in different domains: temporal and spatial ones. They are sensitive to different types of errors. The influence of main experimental errors: phase-step miscalibration, spatial carrier miscalibration, average intensity changes and intensity noise in both the presented techniques on the fringe function determination (|J0| or J02 in case of sinusoidal vibrations), is discussed. The techniques are compared to find the most appropriate one. The time-average technique with heterodyning for small vibration–amplitude measurements is also discussed. The application of the SCPS method to this technique is shown for the first time.
    Optics and Lasers in Engineering 03/2009; 47(3-4):505-511. DOI:10.1016/].optlaseng.2008.03.004 · 2.24 Impact Factor
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    ABSTRACT: The aim of this paper is to analyze 2D fringe pattern denoising performed by two chosen methods based on quasi-1D two-arm spin filter and 2D discrete wavelet transform (DWT) signal decomposition and thresholding. The ultimate aim of this comparison is to estimate which algorithm is better suited for high-accuracy measurements by phase shifting interferometry (PSI) with the phase step evaluation using the lattice site approach. The spin filtering method proposed by Yu et al. (1994) was designed to minimize possible fringe blur and distortion. The 2D DWT also presents such features due to a lossless nature of the signal wavelet decomposition. To compare both methods, a special 2D histogram introduced by Gutman and Weber (1998) is used to evaluate intensity errors introduced by each of the presented algorithms. Keywordsinterferometry-fringe analysis-spatial filtering
    Opto-Electronics Review 06/2010; 18(2):155-162. DOI:10.2478/s11772-010-0007-x · 1.67 Impact Factor
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