Observation of the Talbot effect using broadband hard x-ray beam.

School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju, 500-712, Korea.
Optics Express (Impact Factor: 3.53). 11/2010; 18(24):24975-82. DOI: 10.1364/OE.18.024975
Source: PubMed

ABSTRACT We demonstrated the Talbot effect using a broadband hard x-ray beam (Δλ/λ ~1). The exit wave-field of the x-ray beam passing through a grating with a sub micro-meter scale period was successfully replicated and recorded at effective Talbot distance, Z(T). The period was reduced to half at Z(T)/4 and 3/4Z(T), and the phase reversal was observed at Z(T)/2. The propagating wave-field recorded on photoresists was consistent with a simulated result.

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