Prior Knowledge-Based fuzzy Support Vector Regression
ABSTRACT A new method was proposed for incorporating prior knowledge in the form of fuzzy knowledge sets into Support Vector Machine for regression problem. The prior knowledge of Fuzzy IF-THEN rules can be transformed into fuzzy information to generate fuzzy kernel, based on which FSVR (Fuzzy Support Vector Regression) is introduced. The merit of FSVR is that it can incorporate with prior knowledge represented by fuzzy IF-THEN rules to improve the performance of the conventional SVR in incomplete numeral dataset for training. The simulation results are feasible.
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ABSTRACT: The prediction accuracy of several linear genomic prediction models, which have previously been used for within-line genomic prediction, was evaluated for multi-line genomic prediction. Compared to a conventional BLUP (best linear unbiased prediction) model using pedigree data, we evaluated the following genomic prediction models: genome-enabled BLUP (GBLUP), ridge regression BLUP (RRBLUP), principal component analysis followed by ridge regression (RRPCA), BayesC and Bayesian stochastic search variable selection. Prediction accuracy was measured as the correlation between predicted breeding values and observed phenotypes divided by the square root of the heritability. The data used concerned laying hens with phenotypes for number of eggs in the first production period and known genotypes. The hens were from two closely-related brown layer lines (B1 and B2), and a third distantly-related white layer line (W1). Lines had 1004 to 1023 training animals and 238 to 240 validation animals. Training datasets consisted of animals of either single lines, or a combination of two or all three lines, and had 30 508 to 45 974 segregating single nucleotide polymorphisms. Genomic prediction models yielded 0.13 to 0.16 higher accuracies than pedigree-based BLUP. When excluding the line itself from the training dataset, genomic predictions were generally inaccurate. Use of multiple lines marginally improved prediction accuracy for B2 but did not affect or slightly decreased prediction accuracy for B1 and W1. Differences between models were generally small except for RRPCA which gave considerably higher accuracies for B2. Correlations between genomic predictions from different methods were higher than 0.96 for W1 and higher than 0.88 for B1 and B2. The greater differences between methods for B1 and B2 were probably due to the lower accuracy of predictions for B1 (~0.45) and B2 (~0.40) compared to W1 (~0.76). Multi-line genomic prediction did not affect or slightly improved prediction accuracy for closely-related lines. For distantly-related lines, multi-line genomic prediction yielded similar or slightly lower accuracies than single-line genomic prediction. Bayesian variable selection and GBLUP generally gave similar accuracies. Overall, RRPCA yielded the greatest accuracies for two lines, suggesting that using PCA helps to alleviate the "n ≪ p" problem in genomic prediction.Genetics Selection Evolution 01/2014; 46:57. DOI:10.1186/s12711-014-0057-5 · 3.75 Impact Factor
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ABSTRACT: In advanced semiconductor manufacturing, the in-process wafers need to be monitored periodically in order to obtain high stability and high yield rate. However, the actual measurement is usually obtained after all the work-pieces of the same lot have been processed. The parameter drift or shift of the production equipment could not be detected in real-time thereby increasing the production cost. We proposed a quality prediction system (QPS) based on support vector regression (SVR) and fuzzy learning mechanism (FLM) to overcome this problem. The SVR provided good generalization performance for prediction, and the embedded FLM implied a continuous improvement or at least non-degradation of the system performance in an ever changing environment. The effectiveness of the proposed QPS was validated by test on chemical vapor deposition (CVD) process in practical 12-inch wafer fabrication. The results show that the proposed QPS not only fulfills real-time quality measurement of each wafer, but also detects the performance degradation of the corresponding machines from the information of manufacturing process.FUZZ-IEEE 2009, IEEE International Conference on Fuzzy Systems, Jeju Island, Korea, 20-24 August 2009, Proceedings; 01/2009