Article

A clustering approach to multireference alignment of single-particle projections in electron microscopy.

Biocomputing Unit, National Center of Biotechnology (CSIC), Cantoblanco, Madrid 28049, Spain.
Journal of Structural Biology (impact factor: 3.41). 03/2010; 171(2):197-206. DOI:10.1016/j.jsb.2010.03.011 pp.197-206
Source: PubMed

ABSTRACT Two-dimensional analysis of projections of single-particles acquired by an electron microscope is a useful tool to help identifying the different kinds of projections present in a dataset and their different projection directions. Such analysis is also useful to distinguish between different kinds of particles or different particle conformations. In this paper we introduce a new algorithm for performing two-dimensional multireference alignment and classification that is based on a Hierarchical clustering approach using correntropy (instead of the more traditional correlation) and a modified criterion for the definition of the clusters specially suited for cases in which the Signal-to-Noise Ratio of the differences between classes is low. We show that our algorithm offers an improved sensitivity over current methods in use for distinguishing between different projection orientations and different particle conformations. This algorithm is publicly available through the software package Xmipp.

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Keywords

cases
 
classes
 
different kinds
 
different particle conformations
 
different projection directions
 
different projection orientations
 
electron microscope
 
improved sensitivity
 
modified criterion
 
particles
 
projections
 
projections present
 
Signal-to-Noise Ratio
 
single-particles
 
software package Xmipp
 
traditional correlation
 
Two-dimensional analysis
 
two-dimensional multireference alignment
 
useful tool