Conference Paper

A 2-ps Resolution Wide Range BIST Circuit for Jitter Measurement

Ind. Technol. Res. Inst., Hsinchu
DOI: 10.1109/ATS.2007.46 Conference: Asian Test Symposium, 2007. ATS '07. 16th
Source: IEEE Xplore


In this paper, we propose a novel built-in self-test (BIST) circuit to directly measure cycle-to-cycle jitter. The clock-under-test is under-sampled by this measurement circuit and the jitter values are transformed into digital words. A time-amplified technique is applied to obtain relatively higher resolution with smaller hardware overhead. Experimental results show that our proposed circuit is able to measure the jitter providing the clock frequency up to 2 GHz with resolution of 2 picoseconds.

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