Conference Proceeding

A SVD-based approach for estimating the data external to the measurement region in the planar wide-mesh scanning

D.I.I.I.E - University of Salerno, via Ponte Don Melillo, 84084 Fisciano (Salerno), Italy;
11/2005; ISBN: 953-6037-44-0 pp.1- 4 In proceeding of: Applied Electromagnetics and Communications, 2005. ICECom 2005. 18th International Conference on
Source: IEEE Xplore

ABSTRACT This work deals with an effective technique for estimating a proper number of voltage data external to the near-field measurement region in the recently developed planar wide-mesh scanning. It relies on the nonredundant sampling representations of the electromagnetic field and uses the singular value decomposition method to extrapolate the outside samples. This allows one to reduce in a significant way the unavoidable truncation error occurring in the near-field – far-field transformation with planar wide-mesh scanning. Some numerical tests, assessing the accuracy of the technique and its stability with respect to random errors affecting the data, are reported.

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Keywords

allows one
 
effective technique
 
near-field measurement region
 
near-field – far-field transformation
 
nonredundant sampling representations
 
numerical tests
 
proper number
 
random errors
 
singular value decomposition method
 
unavoidable truncation error
 
voltage data external