Conference Proceeding

A Simple and Time-effective Procedure for ADC INL Estimation

Perugia Univ.
06/2005; DOI:10.1109/IMTC.2005.1604296 ISBN: 0-7803-8879-8 In proceeding of: Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE, Volume: 2
Source: IEEE Xplore

ABSTRACT This paper deals with a novel testing technique aimed at estimating the accuracy of analog-to-digital converters (ADC's). Compared with other valuable research results, the main advantage of the proposed approach is the higher testing speed, i.e. the ability of achieving an accurate estimate of the low frequency component of an INL pattern in a shorter time than other standard techniques such as the sinewave histogram test (SHT). The performance of the whole procedure in terms of estimation accuracy has been determined theoretically and validated by means of both simulation and experimental results

0 0
 · 
0 Bookmarks
 · 
21 Views
Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed. The impact factor represents a rough estimation of the journal's impact factor and does not reflect the actual current impact factor. Publisher conditions are provided by RoMEO. Differing provisions from the publisher's actual policy or licence agreement may be applicable.

Keywords

accurate estimate
 
experimental results
 
higher testing speed
 
INL pattern
 
low frequency component
 
main advantage
 
novel testing technique
 
paper deals
 
proposed approach
 
shorter time
 
sinewave histogram test
 
standard techniques
 
valuable research results