Article

Mapping of local conductivity variations on fragile nanopillar arrays by scanning conductive torsion mode microscopy.

Max Planck Institute for Polymer Research, Mainz, Germany.
Nano Letters (impact factor: 13.2). 03/2010; 10(4):1194-7. DOI:10.1021/nl9035274 pp.1194-7
Source: PubMed

ABSTRACT A gentle method that combines torsion mode topography imaging with conductive scanning force microscopy is presented. By applying an electrical bias voltage between tip and sample surface, changes in the local sample conductivity can be mapped. The topography and local conductivity variations on fragile free-standing nanopillar arrays were investigated. These samples were fabricated by an anodized aluminum oxide template process using a thermally cross-linked triphenylamine-derivate semiconductor. The nanoscale characterization method is shown to be nondestructive. Individual nanopillars were clearly resolved in topography and current images that were recorded simultaneously. Local current-voltage characteristics suggest a space-charge limited conduction in the semiconducting nanopillars.

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Keywords

anodized aluminum oxide template process
 
combines torsion mode topography imaging
 
conductive scanning force microscopy
 
electrical bias voltage
 
fragile free-standing nanopillar arrays
 
gentle method
 
local conductivity variations
 
Local current-voltage characteristics
 
local sample conductivity
 
nanoscale characterization method
 
space-charge limited conduction