Conference Proceeding
A study on TSC of aging composite insulators
Beijing Key Lab. of High Voltage & EMC, North China Electr. Power Univ., Beijing, China;
11/2005;
DOI:10.1109/CEIDP.2005.1560667
ISBN: 0-7803-9257-4 pp.245- 248 In proceeding of: Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on
Source: IEEE Xplore
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Keywords
composite insulator
composite insulators
different composite insulators
different samples
experimental results
experimental study
referential criterion
SEM microstructure
test samples
thermally
TSC characteristics