Conference Paper

On the prediction of near-field microcontroller emission

INSA, Toulouse, France
DOI: 10.1109/ISEMC.2005.1513613 Conference: Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on, Volume: 3
Source: IEEE Xplore

ABSTRACT This paper details a predictive approach for the evaluation of the magnetic field radiated by microcontrollers. The simulation is based on the radiation of elementary current dipoles corresponding to the current flowing in supply inductances. A CMOS test chip including six microcontroller cores has been scanned for validation purpose. Preliminary comparison show interesting similarities between measured and simulated scan, which build a valuable link between electrical macro-models and near-field electromagnetic formulations.

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    ABSTRACT: This paper details two approaches for the evaluation of the near field radiated coupling between two nearby integrated circuits and their electromagnetic compatibility. The first method is based on an empirical comparison between the radiated emission level of the aggressor and the radiated susceptibility level of the victim. The second approach is a predictive method which mixes electrical and 3D electromagnetic simulations. While the first method offers a practical and easy mean to forecast a noise margin, the second method allows a more precise evaluation of disturbance risks based on a worst case mutual positioning of both circuits.

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Jun 6, 2014