Heavy ion effects on configuration logic of Virtex FPGAs
ABSTRACT A heavy ion radiation test has been performed to evaluate the SEU sensitivity of Virtex devices. Differently from previous radiation tests, the one here described specifically addresses configuration logic. Previously unreported failure mechanisms have been observed and classified and their corresponding cross sections measured.
Conference Proceeding: On dependability of FPGA-based evolvable hardware systems that utilize virtual reconfigurable circuits.Proceedings of the Third Conference on Computing Frontiers, 2006, Ischia, Italy, May 3-5, 2006; 01/2006