Conference Proceeding

Heavy ion effects on configuration logic of Virtex FPGAs

IASF, INAF, Padova, Italy
08/2005; DOI:10.1109/IOLTS.2005.31 ISBN: 0-7695-2406-0 pp.49 - 53 In proceeding of: On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Source: IEEE Xplore

ABSTRACT A heavy ion radiation test has been performed to evaluate the SEU sensitivity of Virtex devices. Differently from previous radiation tests, the one here described specifically addresses configuration logic. Previously unreported failure mechanisms have been observed and classified and their corresponding cross sections measured.

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Keywords

heavy ion radiation test
 
previous radiation tests
 
SEU sensitivity
 
unreported failure mechanisms