A method for correcting the effect of specimen drift on coherent diffractive imaging
School of Physics, University of Melbourne, Victoria 3010, Australia.Ultramicroscopy (Impact Factor: 2.44). 02/2010; 110(4):359-65. DOI: 10.1016/j.ultramic.2010.01.014
Coherent diffractive imaging involves the inversion of a diffraction pattern to find the wave function at the exit-surface plane of the specimen. It is a promising technique for imaging, for example, nanoparticles with electrons and biological molecules with X-rays. If the illumination is not a plane wave of infinite extent, then a relative drift between the illumination and the object introduces errors into the diffraction pattern; an issue which is often overlooked. This may be of particular importance for applications with electron microscopes which use nanoscale probes. Here we show that beams which are uniform over a sufficiently large region can be used to pose a phase retrieval problem that is immune from specimen drift, provided suitable analysis of the diffraction data is undertaken. The method only applies to objects contained within a support that is smaller than a uniform region of the beam.
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ABSTRACT: Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: descriptions of new developments in the field updated references additional material on aberration corrected instruments and confocal electron microscopy expanded and improved examples and sections to provide stronger clarity. © Springer Science+Business Media, LLC 2010. All rights reserved.
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