A method for correcting the effect of specimen drift on coherent diffractive imaging.
ABSTRACT Coherent diffractive imaging involves the inversion of a diffraction pattern to find the wave function at the exit-surface plane of the specimen. It is a promising technique for imaging, for example, nanoparticles with electrons and biological molecules with X-rays. If the illumination is not a plane wave of infinite extent, then a relative drift between the illumination and the object introduces errors into the diffraction pattern; an issue which is often overlooked. This may be of particular importance for applications with electron microscopes which use nanoscale probes. Here we show that beams which are uniform over a sufficiently large region can be used to pose a phase retrieval problem that is immune from specimen drift, provided suitable analysis of the diffraction data is undertaken. The method only applies to objects contained within a support that is smaller than a uniform region of the beam.
IEEE Concurrency 11/1998; DOI:10.1109/MCC.1998.736436
IEE review 01/1965; 11(10):357. DOI:10.1049/ep.1965.0268 · 0.12 Impact Factor