Multi-Beamlet Focusing of Intense Negative Ion Beams by Aperture Displacement Technique
ABSTRACT Multi-beamlet focusing of an intense negative ion beam has been performed using the beamlet steering by the aperture displacement. The apertures of the grounded grid were displaced as all beamlets of 270 (18 x 15) in the area of 25 cm x 26 cm would be steered to a common point (a focal point) in both the two-stage and the single-stage accelerators. The multi-beamlets were successfully focused and the e-folding half width of 10 cm was achieved 11.2 m downstream from the ion source in both the accelerators. The corresponding gross divergence angle is 9 mrad. The negative ion beamlets are deflected by the magnetic field for the electron deflection at the extraction grid and the deflection direction oppositely changes line by line, resulting in the beam split in the deflection direction. This beamlet deflection was well compensated also using the beamlet steering by the aperture displacement of the grounded grid. The beam acceleration properties related with the beam divergence and the H^- ion current were nearly the same for both the two-stage and the single-stage accelerators, and were dependent on the ratio of the extraction to the acceleration electric fields.