Automatic generation of common-centroid capacitor arrays with arbitrary capacitor ratio
ABSTRACT The key performance of many analog circuits is directly related to
accurate capacitor ratios. It is well known that capacitor ratio
precision is greatly enhanced by paralleling identical size unit
capacitors in a common-centroid geometry. In this paper, a general
algorithm for fitting arbitrary capacitor ratios in a common-centroid
unit-capacitor array is presented. The algorithm gives special care to
both non-integer and identical ratios in order to minimize mismatch. A
method for capacitance mismatch estimation based up-on an oxide gradient
model is also introduced. It enables the comparison of different
unit-capacitor array assignments. Layout issues are discussed with
emphasis on a generic routing model. Both the algorithm and the mismatch
estimation method are implemented in an automatic capacitor array
generation tool
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Page 1
Automatic Generation of Common-Centroid Capacitor Arrays
with Arbitrary Capacitor Ratio
DiaaEldin Sayed Mohamed Dessouky
Faculty of Engineering. Ain Shams University. 1, El-Sarayat St., 11517 Abbaseya. Cairo. Egypt.
diaa.s@ieee.org mohamed.dessouky@ieee.org
Abstract
The key performance of many analog circuits is
directly related to accurate capacitor ratios. It is well
known that capacitor ratio precision is greatly enhanced
by paralleling identical size unit capacitors in a common-
centroid geometry. In this paper, a general algorithm for
fitting arbitrary capacitor ratios in a common-centroid
unit-capacitor array is presented. The algorithm gives
special care to both non-integer and identical ratios in
order to minimize mismatch. A method for capacitance
mismatch estimation based upon an oxide gradient model
is also introduced. It enables the comparison of different
unit-capacitor array assignments. Layout issues are
discussed with emphasis on a generic routing model.
Both the algorithm and the mismatch estimation method
are implemented in an automatic capacitor array
generation tool.
1. Introduction
One of the important issues during the layout phase of
some types of A/D, D/A converters [1] and filters is the
achievement of precise capacitor ratios. Key performance
in most cases depends on capacitor ratios rather than
absolute capacitance. However, this requires complicated
and time-consuming full-custom layout. Even for the
emerging automatic analog layout generation tools [2, 3]
special sophisticated module generators, that include
relevant layout techniques, seem to be indispensable.
Capacitor mismatch can be attributed to two sources of
errors: random and systematic [4]. Random error
mechanisms include both random edge and oxide effects.
Random errors set a minimum limit on the unit
capacitance value for a given accuracy. Also, for a
typical CMOS process, global effects dominate [4].
Common-centroid geometries are thus particularly
important to reduce this type of errors.
On the other hand, systematic mismatch is that part of
the total mismatch where a deterministic trend can be
observed in the mismatch values of various capacitors.
Five sources of systematic mismatch have been identified
and studied in [5]. Based on this, a list of generic layout
rules was developed. Process gradients, for example
gradients in oxide thickness, contribute to systematic
mismatch. The direction of the gradient is a function of
the die location on the wafer [6]. Gradients are generally
assumed to be represented by a linear function [1, 7].
Again common-controid capacitor arrangement helps to
cancel this kind of error.
Most of the published work on capacitance mismatch,
though very limited, is only concerned with the modeling
of different sources of error. Even though it is well
known that the best way to achieve acceptable matching
between multiple capacitors with arbitrary capacitance
ratios is through unit capacitors placed in a common-
centroid capacitor array to form larger capacitors [1], this
process is still done following a case-by-case approach.
Few trials can be found in the literature, which aim to
automate this error-prone and laborious process. In [8],
assignment of unit capacitors is performed under two
basic constraints: At least one neighbor of each unit is
another unit of the same capacitor, in the same time each
capacitor must have at least one unit on either side of the
array. While this method results in a compact array for
arbitrary ratios, common-centroid placement is not
considered at all. In [9], common-centroid placement,
symmetrical routing and parasitic balance are considered
through a special optimization algorithm. However, it is
only restricted to device pairs.
In this paper, a general algorithm for unit-capacitor
assignment of arbitrary capacitor ratios is introduced with
emphasis on non-integer and identical ratios. Being
systematic, the algorithm is suitable to be implemented in
a dedicated capacitor array device generator and
integrated in automatic layout tools. In order to quantify
the mismatch due to oxide gradients, a method that allows
both the estimation of the mismatch due to oxide
gradients and the comparison of various array cell
assignment, is presented. Finally, comparison with a
previous published result [8] is given.
Page 2
2. Mismatch estimation
For a group of capacitors with arbitrary ratio, the ratio
mismatch is calculated for each pair of capacitors and the
largest value is retained. For Ncap capacitors with
capacitance ratio R1:R2:…:RNcap , which after the parallel
unit-capacitor layout becomes R1*:R2*:…:RNcap*, we
define the capacitance ratio mismatch M by:
=
i
R
% 1001. max100. max
*
*
*
*
×
−=×
−
i
j
j
i
j
j
i
j
i
R
R
R
R
R
R
R
R
R
M
(1)
for all i and j. This means that mismatch is always
positive.
If we further assume that mismatch is dominated by
oxide gradients, using a simple integral model similar to
that used for transistors in [10], the equivalent oxide
thickness of each capacitor is defined as:
dxdyyxt
),(
=
AreaCapacitor
t
AreaCapacitor
eq
∫∫
(2)
where the capacitor area is the total area of all parallel
capacitors making-up each capacitor.
A more accurate approach presented in [7] as a
segmented integral model, is followed. In this case, each
capacitance is modeled as the parallel connection of
lumped unit-capacitors. Equation (2) is then used
independently to obtain the equivalent oxide thickness of
each unit-capacitor component.
For example, Fig. 1 shows four capacitors C1, C2, C3
and C4 with a linear oxide gradient α in the direction
specified by the angle θ. If we consider that they are
grouped to form two capacitors Ca=C1+C4 and
Cb=C2+C3 such that Ca:Cb=1:1, according to (1)
41
.max
CCC
Since both Ca and Cb share a common-centroid located at
the center of the capacitor array, using the simple integral
% 1001
41
32
, 1
32
×
−
+
+
−
+
+
=
−
C
CCCC
M
CbCa
(3)
model [10] will render
oxide thickness at the origin, which gives Ca=Cb. But the
segmented integral model [7] gives
1
cos)(
2
1
cos)(
2
1
cos)(
2
1
cos)(
2
Therefore,
0 ttt
CbeqCa eq
==
−−
, where t0 is the
θαθα
sin)(
2
1
01
W SyWSxtt
+−+−=
(4)
θαθα
sin)(
2
1
02
WSyWSxtt
+−++=
(5)
θαθα
sin)(
2
1
03
WSyWSxtt
+++−=
(6)
θαθα
sin)(
2
1
04
WSyWSxtt
++++=
(7)
+=
+=+=
0
4
1
0
1
1
0
4
1
t
1
t
1
41
t
t
t
t
CACC Ca
ε
(8)
and
+=
+=+=
0
3
1
0
2
1
0
3
1
t
2
1
t
32
t
t
t
t
CACCCb
ε
(9)
It is clear that the mismatch ≠ 0 only for a first order
approximation.
Consider the above array with a unit capacitor side (W)
of 25µm, an oxide thickness (t0) of 40nm, an oxide
gradient (α) of 100ppm, a vertical and horizontal spacing
(Sx and Sy) of 1µm. Mismatch variation with the gradient
angle (θ) is calculated and shown in Fig. 2. It is apparent
that for angles of 0°, 90° and 180° mismatch due to the
oxide gradient reaches zero, while it is maximum at 45°
and 135°. We are often concerned with maximum
mismatch since the gradient angle can’t be predicted [6].
3. Algorithm
In this section the proposed systematic algorithm for
unit-capacitor assignment is presented. The inputs are:
•
The number of matched capacitors Ncap
•
The capacitance ratio R1:R2: … :RNcap
•
The unit capacitance Cu, such that C1=CuR1, …
•
A layout shape factor: aspect ratio, …
•
Layout design rules: minimum width and spacing, …
t1
t4t3
t2
x
y
θ
W
Sx
Sy
C1C2
C3C4
Figure 1. Mismatch estimation
0
0
0,05
0,1
0,15
0,2
0,25
153045607590
105120135150165180
Angle (degrees)
Mismatch (%)
Figure 2. Mismatch variation with gradient angle
Page 3
Layout generation proceeds in the following steps:
1. Determination of rows (Nr) and columns (Nc)
2. Assignment of unit capacitors to the array cells
3. Mismatch estimation
4. Layout generation
Each of these steps is described below in more details.
3.1. Array dimensions (Nr × × × × Nc)
All unit capacitors are assumed to be square-shaped
with a side dimension of W µm, which is determined
according to the given Cu and process specific
capacitance. Based on the given layout factor, the unit
capacitor side dimension W, the spacing between adjacent
unit capacitors both in the x- and y-directions (Sx and Sy),
and the total number of unit capacitors Nu given by:
∑
=
i
1
Nr and Nc are calculated.
3.2. Cell assignment
In this step, the units of all capacitors are assigned to
specific cells in the generated array. In order to achieve
common-centroid placement, we studied possible forms
of capacitance ratios and the available geometrical
structures in rectangular arrays suitable to each case.
Capacitor ratios: They are classified into:
•
Even unit-capacitor ratios.
•
Odd unit-capacitor ratios.
•
Non-integer ratios: Theses are non-integer ratios of
the form
y
i
, where i is an integer and y
than one. Special layout techniques exist to realize a non-
integer value of unit-capacitors that preserves the same
area-to-perimeter ratio. For example, i-1 capacitors are
realized using unit square cells, while the last non-unit
capacitor is a rectangular-shaped capacitor with a hole to
control the capacitor perimeter [11], this technique is
adopted since it requires only two adjacent cells.
•
Identical ratios: These are ratios that occur more than
once in the capacitor array. They require a special care in
cell assignment, since they need to be assigned in exactly
the same way for maximum matching.
Geometrical structures: By inspection of the rectangular
array, the geometrical following structures are observed:
•
Circles: A circle is composed of cells having the
same distance from the center of the array. Fig. 3(a)
shows an array example with its available circles. Cells
are placed in groups of circles according to their distance
from the center. There are also an order of cells inside
each circle, the basic idea is that each two consecutive
( )
R
=
=
c
Ni
iu
N
egerreater_intround_to_g
(10)
xx is a ratio less
pair of cells are in a diagonal symmetry with respect to
the array center as shown by the arrows in Fig. 3(a).
5 4 3 4 5
4 2 1 2 4
3 1 0 1 3
4 2 1 2 4
5 4 3 4 5
(a)
1
1
1
1
1
1
2
2
2
1
1
2
3
2
1
1
2
2
2
1
1
1
1
1
1
(b)
Figure 3. (a) Circles and (b) rectangles.
•
same rectangle parallel to the outer array rectangle. Fig.
3(b) shows an array example with its available rectangles.
In order to construct these rectangles, cells in the outer
rectangle of the array are scanned, followed by the inner
rectangle and so on. Note that rectangles are composed of
one or more circles. The order of cells inside each
rectangle starts from the upper left corner and proceeds as
shown by the arrows on Fig. 3(b).
Cell assignment: Depending on ratio types mentioned
above, assignment is done as follows:
•
Even ratios: From the symmetrical nature of the two-
dimensional array, it is obvious that even ratios can be
easily assigned respecting
constraint. They are placed in the circles as follows:
1. For each even ratio, and starting from the
innermost circle, circles with the number of cells that
sum up to exactly the required even ratio are chosen.
2. If circles with the exact sum cannot be found in
the set of available circles, only the smallest available
circle is filled. This ratio is then abandoned.
3. The following even capacitance ratios are
similarly treated.
4. The above process is then repeated till all even
ratios are assigned. This allows maximum
interdigitation between capacitors.
•
Odd ratios: Due to the rectangular nature of the array,
odd ratios create an inherent asymmetry. Only one cell is
taken from each odd ratio and placed in the smallest
available circle(s) to decrease the deviation of their
centroids from the array center. This leaves only even
ratios that are placed as described above.
•
Non-integer ratios: The total number of required cells
is determined, and the ratio is treated either as an odd or
even one as described above. One additional constraint,
however, exists for non-integer ratios: assigned cells (in
circles) must include two adjacent cells for the
rectangular-shaped non-unit capacitor. Routing channels
are either horizontal or vertical. This means that the non-
unit rectangular capacitor should be in the same direction
as that of the routing channels. In order to achieve this
condition during non-integer ratio assignment, after the
Rectangles: A rectangle is composed of cells on the
the common-centroid
Page 4
first circle is assigned, if no adjacent cells in the required
direction are found, an adjacent cell is directly assigned
together with its diagonally opposite cell.
•
Identical ratios: They are placed in rectangles:
1. Starting from the innermost rectangle, rectangle(s)
with the number of cells that sum up to exactly the
number of all unit-capacitors of identical ratios are
reserved.
2. If rectangle(s) with the exact sum can not be found
in the set of available rectangles, larger rectangle(s) are
selected and empty cells are left free such that they are
spaced equidistantly on the rectangle (in fact, empty
cells are chosen on circles).
3. One cell is placed alternatively from each identical
ratio on the rectangle. This guarantees that they are
placed identically with maximum interdigitation.
It is to be noted that for the special case of a capacitor
array with only two capacitors of identical unit-capacitor
ratios, this results in the well-known chessboard-like unit-
capacitor distribution.
Assignment priority: During cell assignment priority is
given to the most critical cases as follows:
1. Ratios less than two, since they may need two
adjacent cells and must be placed nearest to the center.
2. One cell from each odd ratio (placed in the innermost
circles), the remaining ratios thus become all even ones.
3. Identical ratios (in rectangles).
4. Non-integer ratios (in circles with at least two
adjacent cells) and the remaining even ratios (in circles)
placed alternatively in one circle per ratio.
In addition, within each of the above categories, ratios are
ordered from smaller (higher priority) to larger ratios.
Example: Consider five capacitors of unit-capacitance
ratios given by R1:R2:R3:R4:R5 = 1.2:5.8:7:7:8, using
equation (10) we find that the total number of required
cells (Nu) is 30. Fig. 4(a) shows a 6×5 array. The letter
inside each cell indicates circles. The array contains 8
circles grouped in an ascending order (from A to H)
according to their radius, where the center is located at the
middle of the array. The number next to each letter
defines the order of cell assignment inside each circle
shown by the arrows on Fig. 3(a). The ratios contain 3
even ratios (R1, R2 and R5), 2 odd ratios (R3 and R4), 2
non-integer ratios (R1 and R2), 2 identical ratios (R3 and
R4) and one ratio less than 2 (R1).
According to cell assignment priority, cell assignment
proceeds as follows, refer to Fig. 4(b):
1.
R1 is placed in the smallest circle A.
2. Only one unit from each odd ratio (R3 and R4) is
placed in the following circle cells B1 and B2.
3. The sum of cells of identical ratios R3 and R4, which
becomes even after the last step, is 12. The only rectangle
that can hold such number of cells is the outer one. Since
its number of cells (18) is greater than the needed sum, a
circle whose cells are exactly the difference is excluded
(circle F). R3 and R4 are placed alternatively on the
remaining cells of the rectangle.
4. Non-integer and even ratios are then treated, namely
R2 and R5. R2 occupies the rest of circle B, but since no
adjacent cells are found, an appropriate adjacent cell is
directly assigned (cell D3) together with its diagonally
opposite one (cell D4). We then proceed alternatively
between ratios R5 and R2 as follows: the next circle C is
assigned to R5, the following circle D (or its remaining
cells) is assigned to R2, and finally the last empty circle F
is assigned to R5.
3.3. Mismatch estimation
Fig. 5 shows mismatch calculations based on equation
(1), with W=25µm, t0=40nm, α=10ppm. Routing
channels are vertical such that Sx and Sy are 9.1 and
2.6µm respectively in a 0.35-µm process.
3.4. Layout generation
Fig. 6 shows the layout corresponding to the capacitor
array given in Fig. 4. Routing channels are chosen either
horizontally or vertically in order to minimize the routing
area and reduce cross-coupling capacitance. Routing
channels of top plates are separated from those of the
bottom plates to avoid additional coupling capacitance
that alters the value of the original capacitors. Dummy
capacitors surround the array. Interconnect lines extend
on both sides of unit capacitors to reduce errors due to
H4
F6
E4
E2
F4
H2
G4
D4
B4
B2
D2
G2
F1
C1
A1
A2
C2
F2
G1
D1
B1
B3
D3
G3
H1
F3
E1
E3
F5
H3
3
5
4
3
5
4
4
2
2
4
2
3
5
5
1
1
5
5
3
2
3
2
2
4
4
5
3
4
5
3
(a) Circles (b) Cell assignment
Figure 4. Assignment of a 1.2:5.8:7:7:8 ratio
0,15
0,2
0,25
0,3
0,35
0
1530 45607590
105120135150165180
Angle (degrees)
Mismatch (%)
Figure 5. Mismatch with gradient angle of Fig. 4
Page 5
mask misalignment. Holes inside capacitors are added to
realize non-unit ratios while keeping constant area-to-
perimeter ratio [11]. Routing depends on cell assignment.
However, routing lines increase with the number of unit-
capacitors so the added capacitance is approximately
ratioed. It should be noted that the rules given in [5] were
also respected.
4. Comparison
The proposed algorithm is compared to that published
in [8] and shown in Fig. 7(a) for five capacitors of unit-
ratio 1:1.4:2:9.2:17. Both algorithms are capable of
treating arbitrary capacitor ratios. In [8], priority has been
given to minimizing the overall area, while in our case
mismatch minimization is the first concern. Using the
presented algorithm, constructed circles are shown in Fig.
7(b), while assigned unit-capacitors are shown in Fig.
7(c). Mismatch calculations for both cases are shown in
Fig. 8. It is apparent that mismatch due to oxide gradients
is reduced by an order of magnitude in our case.
5. Conclusions
In this paper, common-centroid placement of arbitrary
capacitor ratios is studied. This has resulted in a general
algorithm for unit-capacitor assignment in rectangular
arrays. Being systematic the algorithm is suitable for
CAD implementations. A method for mismatch
estimation is proposed and used to compare different cell
assignment techniques. A module generator for capacitor
arrays is developed. It produces the layout of arbitrary
capacitor ratios based on the above algorithm and
mismatch calculations.
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Figure 6. Layout of the array shown in Fig. 4
0
1
2
3
4
5
015 30 45 60 75 90 105 120 135 150 165 180
Angle (degrees)
Mismatch (%)
This work (Fig. 7(c))
[8] (Fig. 7(a))
Figure 8. Mismatch with gradient angle θ θ θ θ for Fig. 7
1
5
5
5
5
5
5
5
3
5
5
5
4
4
2
2
3
5
5
5
4
4
4
4
5
5
5
5
4
4
4
4
G
E
C
B
B
C
E
G
F
D
B
A
A
B
D
F
F
D
B
A
A
B
D
F
G
E
C
B
B
C
E
G
5
5
5
4
4
5
5
5
5
4
4
1
5
3
4
5
5
4
3
2
2
4
4
5
5
5
5
4
4
5
5
5
(a) array in [8]
Figure 7. Comparison between [8] and this work
(b) Circles (c) This work