Conference Paper

Mixed signal DFT/BIST automation using behavioral modeling

Intel Corp., Sacramento, CA
DOI: 10.1109/SSMSD.2001.914953 Conference: Mixed-Signal Design, 2001. SSMSD. 2001 Southwest Symposium on
Source: IEEE Xplore


One of the hurdles in mixed signal built in self test is
automation. This paper presents a robust mixed signal design for test
and built in self test library based approach for BIST circuit creation,
insertion, verification and test pattern generation that fits into the
existing design flow

2 Reads