Conference Paper

Mixed signal DFT/BIST automation using behavioral modeling

Intel Corp., Sacramento, CA
DOI: 10.1109/SSMSD.2001.914953 Conference: Mixed-Signal Design, 2001. SSMSD. 2001 Southwest Symposium on
Source: IEEE Xplore

ABSTRACT One of the hurdles in mixed signal built in self test is
automation. This paper presents a robust mixed signal design for test
and built in self test library based approach for BIST circuit creation,
insertion, verification and test pattern generation that fits into the
existing design flow

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    ABSTRACT: In order to reduce the number of design iteration for complex mixed signal telecommunication IC's, verification through full chip simulation is a must. The objective is to verify connectivity and functionality for the whole chip including the interface between analog and digital blocks. Efficient top level simulation required the use of a mixed mode (Analog and Digital) simulator. In addition, in order to accomplish this task, behavioral models of all the system building blocks of the design were developed and used to replace the transistor level sub-circuit description. The design sub-blocks were modeled in HDLA
    Mixed-Signal Design, 2000. SSMSD. 2000 Southwest Symposium on; 02/2000