Conference Paper

Test sequence compaction for sequential circuits with reset states

Ehime Univ., Matsuyama
DOI: 10.1109/ATS.2000.893620 Conference: Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Source: IEEE Xplore


Proposes a static test compaction method for sequential circuits with reset states under a single stuck-at fault assumption. The proposed method first finds unremovable vectors by fault-dropping fault simulation or by non-fault-dropping fault simulation. Next, a subset of test vectors other than unremovable vectors are replaced with a reset signal. Detection of faults detected by an original test sequence is guaranteed by logic simulation and fault simulation for test subsequences. Experimental results for benchmark circuits demonstrate the effectiveness of the proposed method

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