Conference Proceeding
Managing automatic test systems in the 1990s
Hewlett-Packard, Sunnyvale, CA;
06/1994;
DOI:10.1109/NAECON.1994.332900
ISBN: 0-7803-1893-5 pp.1233-1239 vol.2 In proceeding of: Aerospace and Electronics Conference, 1994. NAECON 1994., Proceedings of the IEEE 1994 National
Source: IEEE Xplore
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Keywords
aspects
automatic test system
automatic test system management
BASIC test programs
common user interface
data management
execution environments
lower operator training cost
lower TPS development cost
Managing automatic test systems
re-usable test objects
test development
test executive
test program
tester resource management
user interface management