Article

Sequential testing algorithms for multiple fault diagnosis

Mathworks Inc., Natick, MA
IEEE Transactions on Systems Man and Cybernetics - Part A Systems and Humans (impact factor: 2.12). 02/2000; DOI:10.1109/3468.823474 pp.1 - 14
Source: IEEE Xplore

ABSTRACT We consider the problem of constructing optimal and near-optimal
test sequences for multiple fault diagnosis. The computational
complexity of solving the optimal multiple-fault isolation problem is
super exponential, that is, it is much more difficult than the
single-fault isolation problem, which, by itself, is NP-hard. By
employing concepts from information theory and AND/OR graph search and
by exploiting the single fault testing strategies of Pattipati et al.
(1990), we present several test sequencing algorithms for the multiple
fault isolation problem. These algorithms provide a trade-off between
the degree of suboptimality and computational complexity. Furthermore,
we present novel diagnostic strategies that generate a diagnostic
directed graph, instead of a traditional diagnostic tree, for multiple
fault diagnosis. Using this approach, the storage complexity of the
overall diagnostic strategy reduces substantially. The algorithms
developed herein have been successfully applied to several real-world
systems

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Keywords

al
 
algorithms
 
computational complexity
 
diagnostic
 
diagnostic strategy
 
difficult
 
graph search
 
information theory
 
multiple fault diagnosis
 
NP-hard
 
optimal
 
optimal multiple-fault isolation problem
 
single fault testing strategies
 
single-fault isolation problem
 
storage complexity
 
suboptimality
 
super exponential
 
test sequencing algorithms
 
trade-off
 
traditional diagnostic tree