Article

Test sequencing problems arising in test planning and design for testability

University of Connecticut, Storrs, Connecticut, United States
IEEE Transactions on Systems Man and Cybernetics - Part A Systems and Humans (Impact Factor: 2.18). 04/1999; 29(2):153 - 163. DOI: 10.1109/3468.747850
Source: IEEE Xplore

ABSTRACT We consider four test sequencing problems that frequently arise in
test planning and design for testability (DFT) processes. Specifically,
we consider the following problems: (1) how to determine a test sequence
that does not depend on the failure probability distribution; (2) how to
determine a test sequence that minimizes expected testing cost while not
exceeding a given testing time; (3) how to determine a test sequence
that does not utilize more than a given number of tests, while
minimizing the average ambiguity group size; and (4) how to determine a
test sequence that minimizes the storage cost of tests in the diagnostic
strategy. We present various solution approaches to solve the above
problems and illustrate the usefulness of the proposed algorithms

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