Average depths of electron penetration. II. Angular dependence and use to evaluate secondary-electron yield by photons

Osaka Prefecture University, Sakai, Ōsaka, Japan
IEEE Transactions on Nuclear Science (Impact Factor: 1.28). 08/1999; 46(4):910 - 914. DOI: 10.1109/23.790702
Source: IEEE Xplore


In our previous paper [V. Lazurik, V. Moskvin and T. Tabata, IEEE
Trans. Nucl. Sci. 45, pp. 626-31 (1998)] the average depth of electron
penetration, Rav, has been introduced as the average of the
maximum depths on the trajectories of electrons passing through a
target. In the present work the dependence of Rav on the
angle of incidence of an electron beam has been studied. A
semi-empirical equation is derived to calculate Rav as a
function of angle of incidence. We extend the study of Rav
from using it to characterize the average behavior of electron beams in
a target to describing the generation of secondary electrons by photon
beams. It is shown that Rav can be used in a wide variety of
applications in which the characteristic size of the spatial region of
electron production is important

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Available from: Vadim Moskvin, Aug 11, 2013
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