Article
Investigations of whisper gallery mirrors for extreme ultraviolet (EUV) and soft X-rays
Res. Lab. of Electron., MIT, Cambridge, MA
IEEE Journal of Quantum Electronics (impact factor:
1.88).
06/1992;
DOI:10.1109/3.135280
pp.1376 - 1383
Source: IEEE Xplore
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Keywords
candidate surface coatings
newer EUV optical data
oxygen contamination
reflectivities
spectral regime
surfaces
TE peak reflection
TM peak reflection
vicinity
wavelengths
WGM reflectivities
WGMs