Article
Optical nanocrystallography with tip-enhanced phonon Raman spectroscopy.
Department of Chemistry and Department of Physics, University of Washington, Seattle, WA 98195, USA.
Nature Nanotechnology (impact factor:
27.27).
09/2009;
4(8):496-9.
DOI:10.1038/nnano.2009.190
pp.496-9
Source: PubMed
- Citations (25)
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Cited In (0)
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Article: Tip-enhanced Raman spectroscopy of single RNA strands: towards a novel direct-sequencing method.
Angewandte Chemie International Edition 02/2008; 47(9):1658-61. · 13.45 Impact Factor -
Article: High-resolution near-field Raman microscopy of single-walled carbon nanotubes.
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ABSTRACT: We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of approximately 25 nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.Physical Review Letters 04/2003; 90(9):095503. · 7.37 Impact Factor -
Article: Depolarization effect in reflection-mode tip-enhanced Raman scattering for Raman active crystals
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ABSTRACT: Reflection-mode tip-enhanced Raman scattering TERS has the advantage to characterize any sample, particularly opaque, bulk, and multilayered samples. However, the background signal in reflection-mode TERS is huge due to large focus spots associated with an objective lens that has a long working distance. Moreover, for a multilayered and bulk sample, the Raman signal from the bulk layer interferes with the Raman signal on a thin surface layer. This unwanted bulk background signal reduces the sensitivity of the measurement and makes it difficult to get a high-contrast TERS image in the reflection mode. Here, we demonstrate two techniques to suppress the far-field Raman signals coming from the focus area and bulk silicon germanium substrate. First, we reduce the far-field signal by controlling the polarization state of the incident and scattered Raman as well as manipulating the well-defined polarization of a crystalline sample, which strongly depends on the polarization and propagation of the incident light. We used Raman tensor analysis to quantify the far-field Raman intensity at different polarization states of the polarizer and analyzer at varying sample azimuth. The results of the surface-enhanced Raman spectroscopy experiments were in good agreement with the far-field Raman tensor calculation. The polarizer, analyzer, and sample azimuth combination that gives minimum far-field background signals with high contrast in SERS was utilized in the TERS experiment to obtain a high-contrast near-field Raman signal. Both the field enhancement effect and depolarized detection were considered to obtain a high signal-to-noise TERS signal. We found that, for Raman active and thin crystalline samples assembled in bulk materials, the depolarization effect outweighs the field enhancement effect in getting a high-contrast Raman signal. © 2008 American Institute of Physics.
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Keywords
allows crystallography
chemical specificity
crystal classes
crystalline solids
different transverse optical phonon modes
domain identification
ferroic order
individual BaTiO(3)
intrinsic ferroelectric domains
length scales
nanometre length scales
phase transitions
powerful experimental technique
simultaneous symmetry selectivity