Length control and sharpening of carbon nanotube scanning probe microscope tips using carbon nanotube "nanoknife".
ABSTRACT Through nanomanipulation inside scanning electron microscope, a carbon nanotube scanning probe microscope tip was made by connecting a carbon nanotube with a silicon atomic force microscope tip. The carbon nanotube scanning probe microscope tip was then tailored to the desired length and end structure by a "nanoknife" which is a carbon nanotube adhered to a metal tip. Through mapping the same carbon nanotube on SiO2 substrate, it was found that the lateral resolution of the carbon nanotube tips can be improved significantly through sharpening the tip ends, and the sharpened carbon nanotube tips had better performance than commercial silicon tips.
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ABSTRACT: In this paper we present results on the stability and lateral resolution capability of carbon nanotube (CNT) scanning probes as applied to atomic force microscopy (AFM). Surface topography images of ultra-thin films (2–5 nm thickness) obtained with AFM are used to illustrate the lateral resolution capability of single-walled carbon nanotube probes. Images of metal films prepared by ion beam sputtering exhibit grain sizes ranging from greater than 10 nm to as small as ∼2 nm for gold and iridium respectively. In addition, the imaging stability and lifetime of multi-walled carbon nanotube scanning probes are studied on a relatively hard surface of silicon nitride (Si 3 N 4). AFM images of the Si 3 N 4 surface collected after more than 15 h of continuous scanning show no detectable degradation in lateral resolution. These results indicate the general feasibility of CNT tips and scanning probe microscopy for examining nanometre-scale surface features of deposited metals as well as non-conductive thin films. AFM coupled with CNT tips offers a simple and nondestructive technique for probing a variety of surfaces, and has immense potential as a surface characterization tool in integrated circuit manufacture.Nanotechnology 09/2001; 12:363-367. · 3.84 Impact Factor
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ABSTRACT: We report on the precise placement of a single carbon nanotube (CNT) onto a microlectromechanial system (MEMS) structure. Using a hybrid atomic force microscope/scanning electron microscope (AFM/SEM) system, an individual multiwalled CNT was retrieved from a cartridge by the AFM tip, translated to a MEMS device, and then placed across a gap between an actuating and a stationary structure. Progress toward a resistance versus stress/strain measurement on a CNT will be discussed, including SEM images of a MEMS structure we have designed specifically for such a measurement. © 2002 American Institute of Physics.Applied Physics Letters 05/2002; · 3.52 Impact Factor
- Nano Letters 02/2005; 5(1):11-4. · 13.03 Impact Factor