Length Control and Sharpening of Carbon Nanotube Scanning Probe Microscope Tips Using Carbon Nanotube "Nanoknife"
Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, China. Journal of Nanoscience and Nanotechnology
(Impact Factor: 1.56).
03/2009; 9(2):1258-62. DOI: 10.1166/jnn.2009.C133
Through nanomanipulation inside scanning electron microscope, a carbon nanotube scanning probe microscope tip was made by connecting a carbon nanotube with a silicon atomic force microscope tip. The carbon nanotube scanning probe microscope tip was then tailored to the desired length and end structure by a "nanoknife" which is a carbon nanotube adhered to a metal tip. Through mapping the same carbon nanotube on SiO2 substrate, it was found that the lateral resolution of the carbon nanotube tips can be improved significantly through sharpening the tip ends, and the sharpened carbon nanotube tips had better performance than commercial silicon tips.
Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed. The impact factor represents a rough estimation of the journal's impact factor and does not reflect the actual current impact factor. Publisher conditions are provided by RoMEO. Differing provisions from the publisher's actual policy or licence agreement may be applicable.