Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

Optics Express (Impact Factor: 3.53). 10/2012; 20(22):24167-74. DOI: 10.1364/OE.20.024167
Source: PubMed

ABSTRACT Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure.

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