Multilayer porous silicon diffraction gratings operating in the infrared

Nanoscale Research Letters (Impact Factor: 2.48). 11/2012; 7(1):645. DOI: 10.1186/1556-276X-7-645
Source: PubMed

ABSTRACT Transmission diffraction gratings operating at 1,565 nm based on multilayer porous silicon films are modeled, fabricated, and tested. Features down to 2 mum have been patterned into submicron-thick mesoporous films using standard photolithographic and dry etching techniques. After patterning of the top porous film, a second anodization can be performed, allowing an under-layer of highly uniform porosity and thickness to be achieved. High transmission greater than 40% is measured, and modeling results suggest that a change in diffraction efficiency of 1 dB for a 1% change in normalized refractive index can be achieved. Preliminary measurement of solvent vapor shows a large signal change from the grating sensor in agreement with models.

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Available from: Yinong Liu, Jul 30, 2015
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