Absorption Coefficient and Refractive Index of GaN, AIN and AlGaN Alloys
ABSTRACT The design of optoelectronic devices fabricated from III-nitride materials is aided by knowledge of the refractive index and absorption coefficient of these materials. The optical properties of GaN, AIN and A1GaN grown by MOVPE on sapphire substrates were investigated by means of transmittance and reflectance measurements. Thin (less than 0.5 μm) single crystal films were employed to insure that transmission measurements could be obtained well above the optical band gap. The influence of alloy broadening on the absorption edge was investigated by using a series of AlGaN alloy samples with a range of Al compositions. The optical absorption coefficient above the band gap was obtained for AIGaN having up to 38% Al composition. The refractive index below the band gap was determined for the same series of samples. These properties provide information critical to the optimal design of solar blind detectors or other optoelectronic devices.
SourceAvailable from: J. V. Vallerga[Show abstract] [Hide abstract]
ABSTRACT: Recent progress in Gallium Nitride (GaN, AlGaN, InGaN) photocathodes show great promise for future detector applications in Astrophysical instruments. Efforts with opaque GaN photocathodes have yielded quantum efficiencies up to 70% at 120 nm and cutoffs at ~380 nm, with low out of band response, and high stability. Previous work with semitransparent GaN photocathodes produced relatively low quantum efficiencies in transmission mode (4%). We now have preliminary data showing that quantum efficiency improvements of a factor of 5 can be achieved. We have also performed two dimensional photon counting imaging with 25mm diameter semitransparent GaN photocathodes in close proximity to a microchannel plate stack and a cross delay line readout. The imaging performance achieves spatial resolution of ~50mum with low intrinsic background (below 1 event sec-1 cm-2) and reasonable image uniformity. GaN photocathodes with significant quantum efficiency have been fabricated on ceramic MCP substrates. In addition GaN has been deposited at low temperature onto quartz substrates, also achieving substantial quantum efficiency.Proceedings of SPIE - The International Society for Optical Engineering 08/2008; DOI:10.1117/12.790076 · 0.20 Impact Factor
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ABSTRACT: The development of low cost and compact biological agent identification and detection systems, which can be employed in place-and-forget applications or on unmanned vehicles, is constrained by the photodetector currently available. The commonly used photomultiplier tube has significant disadvantages that include high cost, fragility, high voltage operation and poor quantum efficiency in the deep ultraviolet (240-260nm) necessary for methods such as fluorescence-free Raman spectroscopy. A III-Nitride/ SiC separate absorption and multiplication avalanche photodiode (SAM-APD) offers a novel approach for fabricating high gain photodetectors with tunable absorption over a wide spectrum from the visible to deep ultraviolet. However, unlike conventional heterojunction SAM APDs, the performance of these devices are affected by the presence of defects and polarization induced charge at the heterointerface arising from the lattice mismatch and difference in spontaneous polarization between the GaN absorption and the SiC multiplication regions. In this paper we report on the role of defect density and interface charge on the performance of GaN/SiC SAM APDs through simulations of the electric field profile within this device structure and experimental results on fabricated APDs. These devices exhibit a low dark current below 0.1 nA before avalanche breakdown and high avalanche gain in excess of 1000 with active areas 25x larger than that of state of the art GaN APDs. A responsivity of 4 A/W was measured at 365 nm when biased near avalanche breakdown.Proceedings of SPIE - The International Society for Optical Engineering 05/2012; DOI:10.1117/12.918866 · 0.20 Impact Factor
International Journal of High Speed Electronics and Systems 11/2011; 14(01). DOI:10.1142/S012915640400220X