Article
Surface Plasmon Enhanced TIRF Imaging
Langevin Institute, ESPCI, Paris, France
Imaging & Microscopy
10/2009;
11(4):55 - 56.
DOI:10.1002/imic.200990091
pp.55 - 56
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Keywords
background noise
background noise emanating
florescence signal
fluorescence signal 5-6
illumination angles
imaging dynamic membrane events
inner part
SPMFM
Surface Plasmon Mediated Fluorescence Microscopy
Total Internal Reflection Fluorescence Microscopy