Article

Bayes estimation of reliability in stress-strength model of Weibull distribution with equal scale parameters

Microelectronics Reliability 01/1986; 26(2):275-278. DOI: 10.1016/0026-2714(86)90724-9

ABSTRACT The paper provides a Bayesian approach to inference about the reliability in a multicomponent stress-strength system. We consider Bayes' estimator of the system reliability from data consisting of a random sample from the stress distribution and one from the strength distribution when the two distributions are Weibull with equal and known scale parameters. The estimator of λ, ratio of two shape parameters, is also considered. The proposed estimators can be compared with the maximum likelihood estimators (mles). However, the comparison is carried out for single component stress-strength system and the Monte Carlo efficiencies are obtained. It is found that the proposed estimators are better than the corresponding mles.

1 Bookmark
 · 
112 Views
  • [Show abstract] [Hide abstract]
    ABSTRACT: In the modern scenario, reliability has becomes the most challenging and demanding theory. The theory and the methods of reliability analysis have been developed significantly during the last 40 years and have also been acknowledged in a number of publications. So, a reliability engineer is aware about the importance of each reliability measure of the system and its fields. In this research work, a survey of reliability approaches in various fields of engineering and physical sciences is carried out. In this survey, the author tried to provide the major areas i.e. past, current and future trends of reliability methods and applications for the readers.
    International Journal of Systems Assurance Engineering and Management 01/2013; 4(2):101–117.
  • [Show abstract] [Hide abstract]
    ABSTRACT: An attempt has been made in this paper to estimate the reliability of an s-out-of-k system with non-identical component strengths when component strengths follow an exponential distribution. A further assumption is made that all the components are subjected to a common random stress which also follow an exponential distribution. Bayes and maximum likelihood estimators of such system reliability are considered. A Bayes estimate is obtained by using Lindley's approximation. Comparisons are made on the basis of efficiency and Pitman nearness probability through a Monte-Carlo study.
    Microelectronics Reliability 01/1997; 37(6):923-927. · 1.14 Impact Factor