Bayes estimation of reliability in stress-strength model of Weibull distribution with equal scale parameters

Banaras Hindu University, Vārānasi, Uttar Pradesh, India
Microelectronics Reliability (Impact Factor: 1.43). 01/1986; 26(2):275-278. DOI: 10.1016/0026-2714(86)90724-9


The paper provides a Bayesian approach to inference about the reliability in a multicomponent stress-strength system. We consider Bayes' estimator of the system reliability from data consisting of a random sample from the stress distribution and one from the strength distribution when the two distributions are Weibull with equal and known scale parameters. The estimator of λ, ratio of two shape parameters, is also considered. The proposed estimators can be compared with the maximum likelihood estimators (mles). However, the comparison is carried out for single component stress-strength system and the Monte Carlo efficiencies are obtained. It is found that the proposed estimators are better than the corresponding mles.

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