QTL mapping of adult-plant resistance to stripe rust and leaf rust in Chinese wheat cultivar Bainong 64

Institute of Crop Science, National Wheat Improvement Center/The National Key Facility for Crop Gene Resources and Genetic Improvement, Chinese Academy of Agricultural Sciences (CAAS), 12 Zhongguancun South Street, Beijing, 100081, China.
Theoretical and Applied Genetics (Impact Factor: 3.79). 07/2012; 125(6):1253-62. DOI: 10.1007/s00122-012-1910-y
Source: PubMed


Stripe rust and leaf rust, caused by Puccinia striiformis Westend. f. sp. tritici Erikss. and P. triticina, respectively, are devastating fungal diseases of common wheat (Triticum aestivum L.). Chinese wheat cultivar Bainong 64 has maintained acceptable adult-plant resistance (APR) to stripe rust, leaf rust and powdery mildew for more than 10 years. The aim of this study was to identify quantitative trait loci/locus (QTL) for resistance to the two rusts in a population of 179 doubled haploid (DH) lines derived from Bainong 64 × Jingshuang 16. The DH lines were planted in randomized complete blocks with three replicates at four locations. Stripe rust tests were conducted using a mixture of currently prevalent P. striiformis races, and leaf rust tests were performed with P. triticina race THTT. Leaf rust severities were scored two or three times, whereas maximum disease severities (MDS) were recorded for stripe rust. Using bulked segregant analysis (BSA) and simple sequence repeat (SSR) markers, five independent loci for APR to two rusts were detected. The QTL on chromosomes 1BL and 6BS contributed by Bainong 64 conferred resistance to both diseases. The loci identified on chromosomes 7AS and 4DL had minor effects on stripe rust response, whereas another locus, close to the centromere on chromosome 6BS, had a significant effect only on leaf rust response. The loci located on chromosomes 1BL and 4DL also had significant effects on powdery mildew response. These were located at the same positions as the Yr29/Lr46 and Yr46/Lr67 genes, respectively. The multiple disease resistance locus for APR on chromosome 6BS appears to be new. All three genes and their closely linked molecular markers could be used in breeding wheat cultivars with durable resistance to multiple diseases.

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Available from: Caixia Lan, Jul 22, 2015
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    • "rust and stripe rust responses. Stripe rust resistance QTL have been mapped on this chromosome arm in Bainong 64 (Ren et al., 2012b), Pastor (Rosewarne et al., 2012), W-219 (Singh et al., 2000), and Oligoculm (Suenaga et al., 2003), and QTL were detected in ND495 (Chu et al., 2009) and Forno (Messmer et al., 2000) for leaf rust resistance . The relationship between these QTL and Lr67/Yr46 will eventually be confirmed through gene sequencing. "
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    ABSTRACT: Leaf rust and powdery mildew, caused by Puccinia triticina and Blumeria graminis f. sp. tritici, respectively, are widespread fungal diseases of wheat (Triticum aestivum L.). Development of cultivars with durable resistance is crucially important for global wheat production. This paper reviews the progress of genetic study and application of adult plant resistance (APR) to wheat leaf rust and powdery mildew. Eighty leaf rust and 119 powdery mildew APR quantitative trait loci (QTL) have been reported on 16 and 21 chromosomes, respectively, in over 50 publications during the last 15 yr. More important, we found 11 loci located on chromosomes 1BS, 1BL, 2AL, 2BS (2), 2DL, 4DL, 5BL, 6AL, 7BL, and 7DS showing pleiotropic effects on resistance to leaf rust, stripe rust, and powdery mildew. Among these, QTL on chromosomes 1BL, 4DL, and 7DS also correlate with leaf tip necrosis. Fine mapping and cloning of these QTL will be achieved with the advent of cheaper high-throughput genotyping technologies. Germplasm carrying these potential resistance genes will be useful for developing cultivars with durable multidisease resistance. In addition to its non-NBS-LRR (nucleotide binding site-leucine rich repeat) structure, the senescence-like processes induced by Lr34 could be the reason for durability of resistance; however, more information is needed for a full understanding of the molecular mechanism related to durability. Adult plant resistance genes have been used by CIMMYT for more than 30 yr and have also been transferred to many Chinese wheat varieties through shuttle breeding.
    Crop Science 09/2014; 54(5):1907. DOI:10.2135/cropsci2014.02.0162 · 1.58 Impact Factor
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    • "We initially used bulk segregant analysis (BSA) strategy (Michelmore et al., 1991) to identify SRAPs. BSA has been widely used in many crop species for detecting markers linked to genes conferring disease resistance (Hyten et al., 2009) and is a powerful method for identifying molecular markers that show association with a gene of interest or a specific region of the genome (Ren et al., 2012; Salinas et al., 2013). "

    AFRICAN JOURNAL OF BIOTECHNOLOGY 03/2014; 13(12):1314-1322. DOI:10.5897/AJB2013.13021 · 0.57 Impact Factor
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    ABSTRACT: Stripe rust, caused by Puccinia striiformis Westend. f. sp. tritici (Pst), is a severe foliar disease of common wheat (Triticum aestivum L.) in the world. Resistance is the best approach to control the disease. The winter wheat cultivar Lantian 1 has high-temperature resistance to stripe rust. To determing the gene(s) for the stripe rust resistance, Lantian 1 was crossed with Mingxian 169 (M169). Seedlings of the parents, and F1, F2 and F2-3 progenies were tested with races CYR32 of Pst under controlled greenhouse conditions. Lantian 1 has a single partially dominant gene conferred resistance to race CYR32, designated as YrLT1. Simple sequence repeat (SSR) techniques were used to identify molecular markers linked to YrLT1. A linkage group of five SSR markers was constructed for YrLT1 using 166 F2 plants. Based on the SSR marker consensus map and the position on wheat chromosome, the resistance gene was assigned on chromosome 2DL. Amplification of a set of nulli-tetrasomic Chinese Spring lines with SSR marker Xwmc797 confirmed that the resistance gene was located on the long arm of chromosome 2D. Because of its chromosomal location and the high-temperature resistance, this gene is different from previously described genes. The molecular map spanned 29.9 cM, and the genetic distance of two close markers Xbarc228 and Xcfd16 to resistance gene locus was 4.0 and 5.7 cM, respectively. The polymorphism rates of the flanking markers in 46 wheat lines were 2.1 and 2.1%, respectively; and the two markers in combination could distinguish the alleles at the resistance locus in 97.9% of tested genotypes. This new gene and flanking markers should be useful in developing wheat cultivars with high level and possible durable resistance to stripe rust.
    Journal of Integrative Agriculture 06/2013; 12(6):1018–1025. DOI:10.1016/S2095-3119(13)60479-7 · 0.83 Impact Factor
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