Article

Breaking the speed limits of phase-change memory.

Data Storage Institute, Agency for Science, Technology and Research (A*STAR), Singapore.
Science (impact factor: 31.2). 06/2012; 336(6088):1566-9. DOI:10.1126/science.1221561
Source: PubMed

ABSTRACT Phase-change random-access memory (PCRAM) is one of the leading candidates for next-generation data-storage devices, but the trade-off between crystallization (writing) speed and amorphous-phase stability (data retention) presents a key challenge. We control the crystallization kinetics of a phase-change material by applying a constant low voltage via prestructural ordering (incubation) effects. A crystallization speed of 500 picoseconds was achieved, as well as high-speed reversible switching using 500-picosecond pulses. Ab initio molecular dynamics simulations reveal the phase-change kinetics in PCRAM devices and the structural origin of the incubation-assisted increase in crystallization speed. This paves the way for achieving a broadly applicable memory device, capable of nonvolatile operations beyond gigahertz data-transfer rates.

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Keywords

Ab initio molecular dynamics simulations
 
amorphous-phase stability
 
applicable memory device
 
applying
 
capable
 
crystallization speed
 
gigahertz data-transfer rates
 
high-speed reversible switching
 
incubation-assisted increase
 
key challenge
 
leading candidates
 
next-generation data-storage devices
 
nonvolatile operations
 
paves
 
PCRAM devices
 
prestructural
 
structural origin
 

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