Coherent convergent beam electron diffraction for analysis of lattice fitting in PbTe/MgO bi-crystals
Nagoya UniversityInterface Science 08/1997; 4(3):181-189. DOI: 10.1007/BF00240240
Coherent convergent beam electron diffraction is for the first time applied to the analysis of lattice fitting between vacuum-deposited PbTe and MgO thin crystals in the plan-view mode. The possibility of determination of the rigid-body shift is discussed on the basis of simulated diffraction patterns from the bi-crystals as well as the preliminary experimental results obtained by a 200 kV transmission electron microscope with a field emission electron gun. In the analysis, the importance of the position of interference fringes at overlaps of PbTe 200 and MgO 200 diffraction disks and that of the corresponding mirror symmetry in the whole pattern are emphasized in order to determine the rigid-body shift and the probe-position.
Article: High-Resolution Electron Microscopy[Show abstract] [Hide abstract]
ABSTRACT: This book covers both practical and theoretical aspects of atomic resolution transmission electron microscopy. The discovery of the carbon nanotube, the three-dimensional imaging of the ribosome, and the imaging of a single foreign atom inside a thin crystal by energy-filtered transmission electron microscopy have all demonstrated the immense power of this technique. The recent development of aberration-correction devices has brought the spatial resolution of the method below one Angstrom. The emphasis throughout is on a clear presentation of fundamental concepts, and practical advice. The chapters review simple electron optics, phase contrast theory, coherence theory, and imaging theory for thin crystals. The multiple scattering theory is given in full, and the relationship between the various formulations (Bloch-wave, multislice, scattering matrix, Howie-Whelan equations, phase grating etc) is explained. Applications in biology and materials science are covered, with discussions of radiation damage, sample preparation, image processing and super-resolution, electron holography, and aberration correction. The theory of high-angle annular dark field Z-contrast imaging by scanning transmission electron microscopy is given in full. Additional chapters are devoted to electron sources and detectors, fault diagnosis, experimental methods and associated techniques such as channelling effects in X-ray microanalysis, microdiffraction, cathodoluminescence, environmental microscopy and electron energy-loss spectroscopy.Physics Today 01/1981; 34(9). DOI:10.1063/1.2914772 · 4.86 Impact Factor
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