Article

A metrological approach to the investigation of the quantization noise of delta-sigma ADCs

Measurement Techniques (Impact Factor: 0.29). 01/2009; 52(5):521-527. DOI: 10.1007/s11018-009-9297-0

ABSTRACT A metrological approach to the analysis of the quantization noise of delta-sigma analog-to-digital converters is proposed.
The difference between the two signals at the modulator output and the ideal signals are determined. The dependence of the
quantization noise on the amplitude of the input signal and on the frequency band is obtained.

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