Article

X-ray and transmission electron microscopy characterization of twinned CdO thin films grown on a -plane sapphire by metalorganic vapour phase epitaxy

Applied Physics A (impact factor: 1.63). 01/2007; 88(1):61-64. DOI:10.1007/s00339-007-3977-x

ABSTRACT In the frame of studying II–VI oxides of interest in optoelectronic technologies, the structural properties of CdO films grown
by metalorganic vapour phase epitaxy on a-plane sapphire substrates have been analysed. The study has been performed by means
of X-ray diffraction and cross-sectional transmission electron microscopy measurements. CdO films have been found to grow
along [111] with the presence of twinned domains. Asymmetrical reflections have been used to study the crystalline quality
of the twinned domains, independent of each other, as well as to determine their relative population. The analysis has been
made as a function of growth conditions: VI/II precursors molar ratio and growth temperature.

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Keywords

Asymmetrical reflections
 
cross-sectional transmission electron microscopy measurements
 
crystalline quality
 
growth conditions
 
growth temperature
 
metalorganic vapour phase epitaxy
 
structural properties
 
X-ray diffraction
 

M.C. Martínez-Tomás